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1

Strain engineering in SOI-type materials for future technologies

Journal:

Materials Science and Engineering: B

Year:

2005

Language:

english

File:

PDF, 585 KB

english, 2005

2

Proximity effect in DyBaCuO/Ag bilayers as seen by lateral current measurements

Stéphane Tyč, Alain Schuhl, Bruno Ghyselen, Régis Cabanel

Journal:

Physica C: Superconductivity

Year:

1991

Language:

english

File:

PDF, 318 KB

english, 1991

3

A new manufacturing approach for mono-crystalline SiC wafers

Fabrice Letertre, Bruno Ghyselen, Bernard Aspar

Journal:

Year:

2002

Language:

english

File:

PDF, 450 KB

english, 2002

4

[ECS 215th ECS Meeting - San Francisco, CA (May 24 - May 29, 2009)] ECS Transactions - High Temperature Ion Implantation: a Solution for n-Type Junctions in Strained Silicon

Heiermann, Wolfgang, Buca, Dan, Trinkaus, Helmut, Holländer, Bernd, Breuer, Uwe, Kernevez, Nelly, Ghyselen, Bruno, Mantl, Siegfried

Year:

2009

Language:

english

File:

PDF, 466 KB

english, 2009

5

[ECS 215th ECS Meeting - San Francisco, CA (May 24 - May 29, 2009)] ECS Transactions - Flash Lamp Activation of n- and p-type Dopants in Strained and Unstrained SOI and HOI

Minamisava, Renato A., Buca, Dan, Heiermann, Wolfgang, Lanzerath, Franz, Mantl, Siegfried, Skorupa, Wolfgang, Hartmann, Jean-Michel, Ghyselen, Bruno, Kernevez, Nelly, Breuer, Uwe

Year:

2009

Language:

english

File:

PDF, 707 KB

english, 2009

6

UV Raman Spectroscopy Study of Strain Induced by Buried Silicon Nitride Layer in the BOX of Silicon On Insulator Substrates

Paillard, Vincent, Groenen, Jesse, Puech, Pascal, Lamrani, Younes, Kostrzewa, Marek, Widiez, Julie, Barbé, Jean-Charles, Deguet, Chrystel, Clavelier, Laurent, Ghyselen, Bruno

Journal:

MRS Proceedings

Year:

2009

Language:

english

File:

PDF, 322 KB

english, 2009

7

ECS Transactions [ECS 218th ECS Meeting - Las Vegas, NV (October 10 - October 15, 2010)] - LiNbO

Deguet, Chrystel, Pijolat, Mathieu, Blanc, Nicolas, Imbert, Bruno, Loubriat, Sebastien, Defay, Emmanuel, Ricart, Thibault, Clavelier, Laurent, Moulet, Jean Sebastien, Ghyselen, Bruno, Letertre, Fabric

Year:

2010

Language:

english

File:

PDF, 2.14 MB

english, 2010

8

[ECS 215th ECS Meeting - San Francisco, CA (May 24 - May 29, 2009)] ECS Transactions - Low-Temperature Measurements on Germanium-on-Insulator pMOSFETs: Evaluation of the Background Doping Level and Modeling of the Threshold Voltage Temperature Dependence

Van Den Daele, William, Augendre, Emmanuel, Romanjek, Krunoslav, Le Royer, Cyrille, Clavelier, Laurent, Damlencourt, Jean-Francois, Guiot, Eric, Ghyselen, Bruno, Cristoloveanu, S.

Year:

2009

Language:

english

File:

PDF, 493 KB

english, 2009

9

SPIE Proceedings [SPIE Integrated Optoelectronic Devices 2004 - San Jose, CA, United States (Monday 26 January 2004)] Semiconductor Photodetectors - Germanium on double-SOI photodetectors for 1550-nm operation

Dosunmu, Olufemi I., Linden, Kurt J., Dereniak, Eustace L., Cannon, Douglas D., Emsley, Matthew K., Ghyselen, Bruno, Liu, Jifeng, Kimerling, Lionel C., Unlu, M. S.

Year:

2004

Language:

english

File:

PDF, 212 KB

english, 2004